Detection and Protection Against Quench/Local Thermal Runaway for a 30 T Cryogen-Free Magnet
Detection and Protection Against Quench/Local Thermal Runaway for a 30 T Cryogen-Free Magnet
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30 T 无制冷剂磁体的淬火/局部热失控检测和保护
DOI：
10.1109/tasc.2021.3059604
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发表时间：
2021
影响因子：
1.8
通讯作者：
Awaji Satoshi
中科院分区：
文献类型：
--
作者：
Badel Arnaud;Okada Tatsunori;Takahashi Kohki;Fujita Shinji;Miyazaki Hiroshi;Ioka Shigeru;Awaji Satoshi
东北大学超导材料高场实验室现有的25 T无致冷剂磁体（25 T CSM）升级为30 T，将在于用REBCO带的一个缠绕代替现有的由Bi-2223制成的高温超导体插入物。新衬垫设计用于产生16 T而不是11 T。为了获得良好的动态特性并允许进行扫掠模式实验，插入件将按照常规方式隔离，就像之前的Bi-2223版本一样。在以前的工作中，我们模拟热失控现象，并表明，一个敏感的耗散电压检测技术可以提供足够的警告，以保护HTS线圈使用外部转储电阻，即使在急剧的局部临界电流下降的情况下。对于30 T插入件，导体将由两个带束组成，以减少由于带性能不均匀或局部损坏而导致的这种急剧Ic下降的机会。我们模拟的淬火动力学在LTS外插加上高温超导插入证明，现有的检测/保护系统的25 T CSM可以重复使用，并确定当前转储动态。然后，我们使用我们的热失控建模工具来研究未来的16 T REBCO插入在局部尖锐缺陷的情况下的行为，并确定其安全保护的现实检测阈值。
The upgrade to 30 T of the existing 25 T cryogen-free magnet (25 T CSM) at the High Field Laboratory for Superconducting Materials, Tohoku Univ., will consist in replacing the existing High Temperature Superconductor insert made of Bi-2223 by one wound using REBCO tape. The new insert is designed to produce 16 T instead of 11 T. In order to have good dynamics and allow sweeping mode experiment, the insert will be conventionally isolated, as it was the case for the previous Bi-2223 version. In previous work we modelled thermal runaway phenomenon and showed that a sensitive dissipative voltage detection technique can give sufficient warning to protect an HTS coil using external dump resistor even in the case of sharp local critical current drop. For the 30 T insert, the conductor will consist of a two tape bundle so as to reduce the chance of such sharp Ic drop due to tape performances inhomogeneities or local damage. We simulate the quench dynamics in the LTS outsert coupled with the HTS insert to demonstrate that the existing detection/protection system of the 25 T CSM can be re-used and determine the current dumping dynamics. We then use our thermal runaway modelling tool to study the behavior of the future 16 T REBCO insert in case of local sharp defect and determine realistic detection threshold for its safe protection.
用于升级 25 T 无制冷剂超导磁体的坚固 REBCO 插入线圈
影响因子：
1.8
作者：
Awaji Satoshi;Badel Arnaud;Okada Tatsunori;Takahashi Kohki;Miyazaki Hiroshi;Hanai Satoshi;Ioka Shigeru;Fujita Shinji;Muto Shogo;Iijima Yasuhiro;Daibo Masanori;Kajikawa Kazuhiro
通讯作者：
Kajikawa Kazuhiro