X-ray diffraction reciprocal space mapping study of the thin film phase of pentacene
X-ray diffraction reciprocal space mapping study of the thin film phase of pentacene
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DOI：
10.1063/1.2736193
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发表时间：
2007-05
影响因子：
4
通讯作者：
H. Yoshida;K. Inaba;N. Sato
中科院分区：
文献类型：
--
作者：
H. Yoshida;K. Inaba;N. Sato
利用X射线衍射倒易空间映射（RSM）研究了并五苯薄膜相的结构。晶体结构为三斜晶系，晶胞参数为：a=0.593nm，B=0.756nm，c=1.565nm，α=98.6°，β=93.3°，γ=89.8°。通过比较观察到的RSM衍射强度与理论计算确定原子位置。
The structure of the thin film phase of pentacene was investigated using x-ray diffraction reciprocal space mapping (RSM). The crystal structure was found to be triclinic with the following lattice parameters: a=0.593nm, b=0.756nm, c=1.565nm, α=98.6°, β=93.3°, and γ=89.8°. Atomic positions were determined by comparing the observed RSM diffraction intensities with theoretical calculations.