Accurate measurements of intrinsic scattering from window materials by use of a vacuum camera
Accurate measurements of intrinsic scattering from window materials by use of a vacuum camera
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使用真空相机精确测量窗户材料的固有散射
DOI:
10.1107/s0021889813002628
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发表时间:
2013
期刊:
影响因子:
--
通讯作者:
M. Takata
中科院分区:
文献类型:
--
作者:
H. Masunaga;K. Sakurai; I. Akiba,K. Ito;M. Takata
The intrinsic scattering from eight window materials commonly used at synchrotron facilities has been evaluated in the range 0.07 < q < 4 nm−1 by the use of a vacuum camera. Poly(oxydiphenylene-pyromellitimide) film, a polyimide film widely used as a window material for vacuum chambers, gave rise to two peaks at q = 0.8 and 4 nm−1. Poly(ether-ether-ketone) gave no Bragg peaks, although the background scattering was relatively high over the entire q range. When natural mica, synthetic mica, quartz glass, beryllium, silicon nitride and silicon carbide were compared, synthetic mica showed the lowest scattering in the range 0.6 < q < 5 nm−1, indicating that it is the most suitable window material for this q range.