ELEMENT-SPECIFIC MAGNETIC PROPERTIES OF CO2MNSI THIN FILMS
ELEMENT-SPECIFIC MAGNETIC PROPERTIES OF CO2MNSI THIN FILMS
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CO2MSI 薄膜的元素特定磁性
DOI：
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发表时间：
2005
期刊：
影响因子：
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通讯作者：
Vincent G. Harris
中科院分区：
文献类型：
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作者：
S. Stadler;D. Minott;D. Harley;J. Craig;Mahmud Tareq Hassan Khan;I. Dubenko;Naushad Ali;K. Story;J. Dvorak;Y. Idzerda;Dario Arena;Vincent G. Harris
采用脉冲激光沉积法在Al_2O_3（a面）和GaAs（001）衬底上以及氮化硅薄膜窗口上生长了Co_2MnSi薄膜。角度相关的磁光克尔效应测量揭示了GaAs（001）上生长的薄膜的单轴和四重磁晶各向异性。在薄膜的L2，3边缘处测量了X射线磁性圆二色性光谱，作为铝盖层厚度的函数，并测量了通过在氮化硅膜上生长的1000-A Co2 MnSi膜的透射模式L2，3 X射线吸收，表明与类金属光谱的偏差可能是由于氧化或污染。元素特定的时刻Co和Mn的计算从X射线磁性圆二色性数据的非氧化膜。
Co2MnSi thin films were grown on Al2O3 (a plane) and GaAs (001) substrates and on thin silicon nitride windows using pulsed laser deposition. Angle-dependent magneto-optic Kerr effect measurements reveal both a uniaxial and a fourfold magnetocrystalline anisotropy for films grown on GaAs (001). X-ray magnetic circular dichroism spectra were measured at the L2,3 edges of the thin films as a function of aluminum cap layer thickness, and transmission mode L2,3 x-ray absorption through a 1000-A Co2MnSi film grown on a silicon nitride membrane were measured, indicating that deviations from metalliclike spectra are likely due oxidation or contamination. Element-specific moments for Co and Mn were calculated from the X-ray magnetic circular dichroism data of a nonoxidized film.