Characterization of Cu(In,Ga)Se 2 /Mo Interface in CIGS Solar Cells
Characterization of Cu(In,Ga)Se 2 /Mo Interface in CIGS Solar Cells
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CIGS 太阳能电池中 Cu(In,Ga)Se 2 /Mo 界面的表征
DOI:
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发表时间:
1997
期刊:
影响因子:
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通讯作者:
T. Wada
中科院分区:
文献类型:
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作者:
S. Nishiwaki;N. Kohara;T. Negami;M. Nishitani;T. Wada
The interface between a Cu(In,Ga)Se{sub 2} (CIGS) and an underlying Mo layer was studied by X-ray diffraction and high resolution transmission electron microscopy. The CIGS layer was deposited onto Mo coated soda-lime glass using the 3-stage process. A MoSe{sub 2} layer found to form at the CIGS/Mo interface during the 2nd stage of the 3-stage process. The thickness of the MoSe{sub 2} layer depended on the substrate temperature used for CIGS film deposition as well as the Na content of the CIGS and/or Mo layers. For higher substrate temperatures, thicker MoSe{sub 2} layers were observed. The Na in the CIGS and/or Mo layer is felt to assist in the formation of MoSe{sub 2}. Current-Voltage measurements of the heterojunction formed by the CIGS/Mo interface were ohmic even at low temperature. The role of the MoSe{sub 2} layer in high efficiency CIGS solar cells is discussed.