Transparent Pin Wear Test on Thin-Film Magnetic Disk
Transparent Pin Wear Test on Thin-Film Magnetic Disk
复制标题
薄膜磁盘上的透明销磨损测试
DOI：
10.1115/1.2831246
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发表时间：
1995
影响因子：
2.5
通讯作者：
Y. Yahisa
中科院分区：
文献类型：
--
作者：
Y. Kawakubo;Y. Yahisa
使用透明材料对薄膜磁盘进行销-盘磨损试验。石英玻璃（QG），透明氧化锆（TZ），蓝宝石（SA），和合成金刚石（DI）被用作针材料。除摩擦外，还用摄像机连续监测滑动条件和销磨损。同时进行的摩擦测量和视频监控表明，当磨损碎屑侵入销盘表面时，摩擦力下降。从测量的球形销上的磨痕直径来看，销磨损按DI、SA、QG和TZ的顺序增加。这种针磨损的顺序与针体硬度的顺序不一致。圆盘寿命按TZ、QG、SA和DI的顺序增加，并且销磨损越小，圆盘寿命越长。
Pin-on-disk wear tests on thin-film magnetic disks were performed using transparent materials. Quartz glass (QG), transparent zirconia (TZ), sapphire (SA), and synthesized diamond (DI) were used as pin materials. In addition to friction, sliding condition and pin wear were continuously monitored with video camera. Simultaneous friction measurement and video monitoring showed that friction dropped when wear debris intruded between pin and disk surfaces. Pin wear, from the measured diameter of wear scar on spherical pins, increased in the order of DI, SA, QG, and TZ. This order of pin wear does not coincide with that of the pin bulk hardness. Disk lifetime increased in the order of TZ, QG, SA, and DI, and the smaller the pin wear, the longer the disk lifetime.