Atom-technology and beyond: manipulating matter using scanning probes
Atom-technology and beyond: manipulating matter using scanning probes
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DOI：
10.1039/9781849734844-00116
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发表时间：
2013-01-01
期刊：
影响因子：
--
通讯作者：
Moriarty, Philip
中科院分区：
文献类型：
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作者：
Moriarty, Philip
扫描探针显微镜（SPM）的最新技术已经超越了“仅仅”单个原子和分子的成像和操作，涵盖了各种可能最好被称为“下一代”实验的令人兴奋的东西。这些技术包括亚原子分辨率成像、空间分辨率接近100 μ m的分子力场的绘制、精细水平的二维电子系统的控制以及与宏观世界接触的单原子器件的制造。诸如此类的发展，以及许多其他跨越过去18个月左右的SPM研究，在这里进行审查。它们代表了微微科学领域的出现，因为SPM技术和技术朝着亚埃长度尺度上的物质的常规测量和控制发展。
The state of the art in scanning probe microscopy (SPM) has moved beyond 'just' the imaging and manipulation of single atoms and molecules to encompass an exciting variety of what might perhaps best be termed 'next generation' experiments. These include sub-atomic resolution imaging, the mapping of molecular force-fields with similar to 100pm spatial resolution, the control of two dimensional electron systems with exquisite levels of finesse, and the fabrication of single atom devices contacted to the macroscopic world. Developments such as these, and many others spanning the last eighteen months or so of SPM research, are reviewed here. They represent the emergence of the field of picoscience, as SPM techniques and technology evolve towards routine measurement and control of matter on sub-Angstrom length-scales.