Novel Application of Anomalous (Resonance) X-ray Scattering for Structural Characterization of Disordered Materials
Novel Application of Anomalous (Resonance) X-ray Scattering for Structural Characterization of Disordered Materials
复制标题
反常(共振)X 射线散射在无序材料结构表征中的新应用
DOI:
10.1007/bfb0025745
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发表时间:
1984
期刊:
影响因子:
--
通讯作者:
Y. Waseda
中科院分区:
文献类型:
--
作者:
Y. Waseda
The anomalous x= ray scattering has been known for a long time and a large amount of both experimental and theoretical effort has been devoted to the understanding of the anomalous (resonance} scattering phenomena and its application to the structural determination of various materials. In the last ten years, significant progress has been made, although the quantitative information is often accepted with some reservation, mainly due to the experimental difficulties. Nevertheless, the anomalous x-ray scattering has recently drawn a great deal of attention, because the use of the synchrotron radiation as an x-ray source in this technique is likely to reduce the experimental difficulties un-solved by a conventional x-ray source. Thus the anomalous x-ray scattering should become, in the near future, one of the most reliable and powerful tools for determining the fine structure of various materials and its potential application to the structural study of disordered materials is now well-recognized. The main purpose of this chapter is to present some selected recent experimental results on the structural characterization by the anomalous x-ray scattering technique including present problems and future directions on the novel application of this technique for structural study of disordered materials. These topics include not only liquids and amorphous solids but also solid fast ion cunductors because their ionic transport properties imply that the cations in some solid fast ion conductors are in the liquid-like disordered state, although they are macroscopically still in the typical solid state. As shown later, the anomalous x-ray scattering provides a straightforward answer on such questions.