Temperature and Thickness Dependences of the Anisotropic In‐Plane Thermal Conductivity of Black Phosphorus
Temperature and Thickness Dependences of the Anisotropic In‐Plane Thermal Conductivity of Black Phosphorus
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DOI：
10.1002/adma.201603756
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发表时间：
2017-02
影响因子：
29.4
通讯作者：
Brandon Smith;B. Vermeersch;J. Carrete;E. Ou;Jaehyun Kim;N. Mingo;D. Akinwande;Li Shi
中科院分区：
文献类型：
--
作者：
Brandon Smith;B. Vermeersch;J. Carrete;E. Ou;Jaehyun Kim;N. Mingo;D. Akinwande;Li Shi
由一种新的四探针测量方法得到的薄黑磷的各向异性基面热导率在低温下比以前的报道显示出更高的峰值。第一性原理计算揭示了晶体缺陷和弱厚度依赖性的重要作用，这与石墨烯和石墨的情况相反，因为在起皱的磷烯中没有反射对称性。
The anisotropic basal-plane thermal conductivities of thin black phosphorus obtained from a new four-probe measurement exhibit much higher peak values at low temperatures than previous reports. First principles calculations reveal the important role of crystal defects and weak thickness dependence that is opposite to the case of graphene and graphite due to the absence of reflection symmetry in puckered phosphorene.