Direct measurement of the Josephson plasma resonance frequency from I-V Characteristics
Direct measurement of the Josephson plasma resonance frequency from I-V Characteristics
复制标题
从 I-V 特性直接测量约瑟夫森等离子体共振频率
DOI：
10.1109/tasc.2005.849700
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发表时间：
2005
影响因子：
1.8
通讯作者：
K. Delin
中科院分区：
文献类型：
--
作者：
A. Kleinsasser;M.W. Johnson;K. Delin
约瑟夫森电路的速度，例如快速单通量量子逻辑所需的速度，受到约瑟夫森等离子体频率/spl ω//sub p/的限制，该频率（除了少数例外）随着临界电流密度J/sub c/的增加而单调增加。在这里，我们描述了一种新的技术，用于直接测量/spl Ω//子p/，使用一个简单的结构的电流-电压特性的基础上，外部分流，串联连接的隧道结。我们提出的技术的实验和理论演示，并描述其应用程序的结电容的测定，一个属性差，其特征在于高J/子C/结。
The speed of Josephson circuits such as those required for rapid single flux quantum logic is limited by the Josephson plasma frequency, /spl omega//sub p/, which (with few exceptions) increases monotonically with increasing critical current density, J/sub c/. Here we describe a new technique for directly measuring /spl omega//sub p/, using the current-voltage characteristics of a simple structure based on externally-shunted, series-connected tunnel junctions. We present both experimental and theoretical demonstrations of the technique and describe its application to the determination of the junction capacitance, a property poorly characterized for high-J/sub c/ junctions.