Defect-Induced Atomic Migration in Carbon Nanopeapod: Tracking the Single-Atom Dynamic Behavior
Defect-Induced Atomic Migration in Carbon Nanopeapod: Tracking the Single-Atom Dynamic Behavior
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DOI：
10.1021/nl048416o
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发表时间：
2004-11
期刊：
影响因子：
10.8
通讯作者：
K. Urita;Y. Sato;K. Suenaga;A. Gloter;A. Hashimoto;M. Ishida;T. Shimada;H. Shinohara;S. Iijima
中科院分区：
文献类型：
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作者：
K. Urita;Y. Sato;K. Suenaga;A. Gloter;A. Hashimoto;M. Ishida;T. Shimada;H. Shinohara;S. Iijima
我们在这里展示了Tb，Gd或Ce金属的单原子迁移从笼到笼通过故意诱导的原子路径内的碳纳米豆荚。原子路径实际上是在TEM观察期间在富勒烯笼中诱导的原子缺陷（空位）。由此证明，电子辐照可以击穿原子笼，使被囚禁的金属原子破笼而出。结果明确地表明了一种替代方法的可能性，即在不使用SPM尖端的情况下转移单个原子，而是使用富勒烯等“原子携带袋”。
We demonstrate here the single-atom migration of Tb, Gd, or Ce metal from cage to cage through an intentionally induced atomic path within a carbon nanopeapod. The atomic path is actually an atomic defect (vacancy) induced at the fullerene cage during TEM observation. It is therefore proved that the atomic cage can be punctured by electron irradiation so that the imprisoned metal atoms can break out. The results definitively indicate the possibilities for an alternative method to transfer single atoms without using SPM tips but by using an “atomic carry-bag” such as fullerene.