Electrical properties of individual NiFe/Pt multilayer nanowires measured in situ in a scanning electron microscope
Electrical properties of individual NiFe/Pt multilayer nanowires measured in situ in a scanning electron microscope
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DOI：
10.1063/1.3679558
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发表时间：
2012-02-01
影响因子：
3.2
通讯作者：
Inkson, Beverley J.
中科院分区：
文献类型：
--
作者：
Elawayeb, Mohamed;Peng, Yong;Inkson, Beverley J.
单个 NiFe/Pt 多层纳米线的电性能已通过扫描电子显微镜中的纳米操纵器进行了原位测量。对具有多晶微结构的直径为50 nm的单个NiFe/Pt多层纳米线的电学测量表明，该纳米线的电阻率约为2.2 x 10(-7) Omega m(对应于电导率约为4.5 x 10(6) Omega(-1) m(-1))，单个NiFe-Pt界面的平均电阻约为0.2 Omega。测得单个NiFe/Pt纳米线的最大失效电流密度为9.63 x 10(11) A m(-2)。 (C) 2012 年美国物理研究所。 [doi:10.1063/1.3679558]
The electrical properties of individual NiFe/Pt multilayer nanowires have been measured in situ by nanomanipulators in a scanning electron microscope. The electrical measurement of similar to 50 nm diameter individual NiFe/Pt rnultilayer nanowires with polycrystalline microstructure shows that the nanowires have a resistivity of similar to 2.2 x 10(-7) Omega m (corresponding to a conductivity of similar to 4.5 x 10(6) Omega(-1) m(-1)) and average resistance of individual NiFe-Pt interfaces of similar to 0.2 Omega. The maximum failure current density of an individual NiFe/Pt nanowire was measured to be 9.63 x 10(11) A m(-2). (C) 2012 American Institute of Physics. [doi:10.1063/1.3679558]