Systematic and collaborative approach to problem solving using X-ray photoelectron spectroscopy
Systematic and collaborative approach to problem solving using X-ray photoelectron spectroscopy
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DOI：
10.1016/j.apsadv.2021.100112
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发表时间：
2021-06-15
影响因子：
6.2
通讯作者：
Baltrusaitis, Jonas
中科院分区：
文献类型：
--
作者：
Fairley, Neal;Fernandez, Vincent;Baltrusaitis, Jonas
这项工作中提出的方法是许多在 CasaXPS 光谱处理和解释程序框架内操作的初级和高级 X 射线光电子能谱 (XPS) 用户之间多年互动的结果。特别是，一系列研讨会的讨论是开发整体 XPS 数据处理概念的重要来源，也是创建这项工作的动力。这些研讨会由南特材料研究所 Jean Rouxel (IMN) 组织，聚集了 XPS 的经验丰富和新手用户，进行为期一周的概念实验设计和由此产生的数据处理的讨论。然而，这些研讨会中构建和使用的框架鼓励传播 XPS 数据分析之外的知识，并强调多学科协作方法对解决表面分析问题的重要性。这里介绍的材料体现了源自 2013 年 Roscoff 举办的第一届 CNRS 主题研讨会提供的数据的数据处理。这里描述的方法在 2016 年和 2019 年的后续研讨会中不断发展，目前代表了 CasaXPS 光谱数据处理范例中使用的原理。
The methodology presented within this work is a result of years of interactions between many junior and senior X-ray Photoelectron Spectroscopy (XPS) users operating within the CasaXPS spectral processing and interpretation program framework. In particular, discussions arising from a series of workshops have been a significant source for developing the overall XPS data processing concept and are the motivation for creating this work. These workshops organized by the Institut des Materiaux Jean Rouxel (IMN), Nantes gather both experienced and novice users of XPS for a week of discourse in conceptual experiment design and the resulting data processing. However, the framework constructed and utilized within these workshops encouraged the dissemination of knowledge beyond XPS data analysis and emphasized the importance of a multi-disciplinary collaborative approach to surface analysis problem-solving. The material presented here embodies data treatment originating from data made available to the first CNRS Thematic Workshop presented at Roscoff 2013. The methodology described here has evolved over the subsequent workshops in 2016 and 2019 and currently represents the philosophy used in CasaXPS spectral data processing paradigm.