Reliability assessment of CMOS differential cross-coupled LC oscillators and a novel on chip self-healing approach against aging phenomena
Reliability assessment of CMOS differential cross-coupled LC oscillators and a novel on chip self-healing approach against aging phenomena
复制标题
CMOS 差分交叉耦合 LC 振荡器的可靠性评估和针对老化现象的新型片上自愈方法
DOI：
--
复制
发表时间：
2014
期刊：
影响因子：
--
通讯作者：
I. F. Baskaya
中科院分区：
文献类型：
--
作者：
Engin Afacan;Günhan Dündar;I. F. Baskaya
