Grazing incidence small-angle X-ray scattering:: an advanced scattering technique for the investigation of nanostructured polymer films
Grazing incidence small-angle X-ray scattering:: an advanced scattering technique for the investigation of nanostructured polymer films
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DOI：
10.1007/s00216-003-1869-2
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发表时间：
2003-05-01
影响因子：
4.3
通讯作者：
Müller-Buschbaum, P
中科院分区：
文献类型：
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作者：
Müller-Buschbaum, P
掠入射小角X射线散射（GISAXS）克服了传统小角X射线散射在薄膜几何形状中相对于极小样品体积的局限性。GISAXS被证明是一个强大的先进的散射技术的纳米结构的聚合物薄膜的调查。与原子力显微镜（AFM）类似，分子尺度和介观尺度之间的大的长度间隔可以用表面敏感散射方法检测。虽然与AFM只有表面形貌是可访问的，与GISAXS的掩埋结构也被探测。由于探测的表面积更大，GISAXS与AFM相比也具有更大的统计显著性。由于对准直的要求很高，GISAXS实验是基于同步辐射。纳米结构平行和垂直于样品表面观察薄聚（苯乙烯-嵌段-异戊二烯）二嵌段共聚物膜作为一个例子的GISAXS的可能性。
With grazing incidence small-angle X-ray scattering (GISAXS) the limitations of conventional small-angle X-ray scattering with respect to extremely small sample volumes in the thin-film geometry are overcome. GISAXS turned out to be a powerful advanced scattering technique for the investigation of nanostructured polymer films. Similar to atomic force microscopy (AFM), a large interval of length between molecular and mesoscopic scales is detectable with a surface-sensitive scattering method. While with AFM only surface topographies are accessible, with GISAXS the buried structure is also probed. Because a larger surface area is probed, GISAXS also has a much larger statistical significance compared to AFM. Due to the high demand on collimation, GISAXS experiments are based on synchrotron radiation. Nanostructures parallel and perpendicular to the sample surface observable in thin poly(styrene-block-isoprene) diblock copolymer films are presented as an example of the possibilities of GISAXS.