Near-edge X-ray refraction fine structure microscopy
Near-edge X-ray refraction fine structure microscopy
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DOI：
10.1063/1.4975377
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发表时间：
2017-02
影响因子：
4
通讯作者：
M. Farmand;R. Celestre;P. Denes;A. Kilcoyne;S. Marchesini;H. Padmore;T. Tyliszczak;T. Warwick;Xiaowen Shi;James Lee;Young-Sang Yu;J. Cabana;J. Joseph;Harinarayan Krishnan;T. Perciano;F. Maia;D. Shapiro
中科院分区：
文献类型：
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作者：
M. Farmand;R. Celestre;P. Denes;A. Kilcoyne;S. Marchesini;H. Padmore;T. Tyliszczak;T. Warwick;Xiaowen Shi;James Lee;Young-Sang Yu;J. Cabana;J. Joseph;Harinarayan Krishnan;T. Perciano;F. Maia;D. Shapiro
我们展示了一种通过在软 X 射线光谱显微镜中使用全折射参考光谱来获得纳米级化学成分图的空间分辨率和特异性的方法。使用软 X 射线叠层成像技术，我们测量通过原始参考材料的 X 射线吸收和折射作为光子能量的函数，并使用这些参考光谱作为分解异质样品的空间分辨光谱的基础，从而以高分辨率量化成分。虽然传统仪器仅限于吸收对比度，但我们基于折射的新颖方法利用了强能量依赖的散射截面，并且可以看到共振空间分辨率提高了近五倍。
We demonstrate a method for obtaining increased spatial resolution and specificity in nanoscale chemical composition maps through the use of full refractive reference spectra in soft x-ray spectro-microscopy. Using soft x-ray ptychography, we measure both the absorption and refraction of x-rays through pristine reference materials as a function of photon energy and use these reference spectra as the basis for decomposing spatially resolved spectra from a heterogeneous sample, thereby quantifying the composition at high resolution. While conventional instruments are limited to absorption contrast, our novel refraction based method takes advantage of the strongly energy dependent scattering cross-section and can see nearly five-fold improved spatial resolution on resonance.