Monitoring grain boundary migration during recrystallisation using topotomography
Monitoring grain boundary migration during recrystallisation using topotomography
复制标题
使用地形断层扫描监测再结晶过程中的晶界迁移
DOI：
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发表时间：
2010
期刊：
影响因子：
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通讯作者：
D. Jensen
中科院分区：
文献类型：
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作者：
S. V. Boxel;S. Schmidt;W. Ludwig;Yubin Zhang;H. Sørensen;W. Pantleon;D. Jensen
本文用同步辐射topotomo技术研究了单晶粒再结晶过程中{001} 100取向单晶的生长。使用一种新的方法来分析单个刻面的形成和迁移，该方法在不同的时间步长沿沿着垂直于刻面平面的平行线测量晶界段之间的距离。一个小平面被示出以恒定速率移动，而它保持平面并且保持相同的边界平面取向。另一个方面的形成，这是详细分析，揭示了第一个平面边界与不同的方向形成之前，它改变其边界平面的方向到最后的小平面。有人认为，移动晶界前的局部微观结构配置有相当大的影响，个别边界段和刻面的动力学。
The growth of a single grain during recrystallisation into a mildly deformed {001} 100 oriented single crystal has been monitored by synchrotron radiation using the topotomo technique. The formation and migration of individual facets is analysed using a new method which measures distances between grain boundary segments at different time steps along parallel lines normal to the facet plane. One facet is shown to move with a constant rate, while it remains planar and keeps the same boundary plane orientation. The formation of another facet, which is analysed in detail, reveals that first a planar boundary with a different orientation forms before it changes its boundary plane orientation into that of the final facet. It is argued that the local microstructural configuration in front of moving grain boundaries has a considerable influence on the kinetics of individual boundary segments and facets.