Nanoindentation hardness and adhesion investigations of vapor deposited nanostructured diamond films
Nanoindentation hardness and adhesion investigations of vapor deposited nanostructured diamond films
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DOI:
10.1063/1.1464233
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发表时间:
2002-04-15
影响因子:
3.2
通讯作者:
Lemons, JE
中科院分区:
文献类型:
--
作者:
Catledge, SA;Borham, J;Lemons, JE
The effect of changing the N-2/CH4 feedgas ratio on the structure and mechanical properties of microwave plasma chemical vapor deposited diamond films grown on Ti-6Al-4V alloy substrates was investigated. The relative concentration of CH4 and N-2 (in a balance of H-2) was shown to strongly influence film structure, hardness, and adhesion. For high CH4 concentration (15% by volume), nanostructured diamond films with roughness magnitudes of 15-30 nm, good adhesion and a high hardness value of 90 GPa was obtained. A distinct correlation was found between the nanoindentation hardness of the deposited film and the N-2/CH4 ratio in the plasma, as well as a correlation of hardness to the ratio of the Raman peak intensities (1332 and 1555 cm(-1)). Scratch adhesion testing of nanostructured diamond films showed delamination at a critical force of 33 N using acoustic emission techniques. These results demonstrate that nanostructured diamond films can be tailored on metallic surfaces with hardness ranging from 10 GPa (medium-hard) to 100 GPa (superhard) and may be considered for wear resistant applications such as in the design of articulating medical implant devices. (C) 2002 American Institute of Physics.