Two-wavelength method for full-field automated photoelasticity
Two-wavelength method for full-field automated photoelasticity
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DOI：
10.1007/bf02329804
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发表时间：
1999-12
影响因子：
2.4
通讯作者：
N. Plouzennec;A. Lagarde
中科院分区：
文献类型：
--
作者：
N. Plouzennec;A. Lagarde
本文提出了一种全场测定等倾角α和等色线参数θ的新方法。这两个参数的计算过程中出现的问题，解决了使用两个不同的波长。实际上，当单色光被用作入射光时，α在λ等于2kπ的点处是不可测量的。在这种方法中，每个单色光可以补偿反射的影响，以获得整个模型的等倾角。此外，大多数方法计算分数条纹阶数，然后展开以获得等色参数。这种展开过程需要初始化，这不能仅用一个等色条纹图案来自动进行。使用两个波长允许一个完整的自动展开的等色参数，即使是初始化的过程。
A new method for the whole-field determination of the isoclinic angle α and the isochromatic parameter ϕ is presented. The problems appearing during the calculation of these two parameters are solved with the use of two different wavelengths. Indeed, when a monochromatic light is used as an incident light, α is not measurable at the points where ϕ is equal to 2kπ. In this method, each monochromatic light can compensate for the influence of ϕ to obtain the isoclinic angle for the entire model. Also, most of the methods calculate the fractional fringe order that is unwrapped afterward to obtain the isochromatic parameter. This unwrapping process needs an initialization, which cannot be automatic with only one isochromatic fringe pattern. The use of two wavelengths permits a complete automatic unwrapping of the isochromatic parameter, even for the initialization of the process.