Tutorial on use of intraclass correlation coefficients for assessing intertest reliability and its application in functional near-infrared spectroscopy-based brain imaging
Tutorial on use of intraclass correlation coefficients for assessing intertest reliability and its application in functional near-infrared spectroscopy-based brain imaging
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DOI：
10.1117/1.jbo.20.5.050801
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发表时间：
2015-05-01
影响因子：
3.5
通讯作者：
Liu, Hanli
中科院分区：
文献类型：
--
作者：
Li, Lin;Zeng, Li;Liu, Hanli
神经影像测量的重测可靠性是人脑认知功能研究中的一个重要问题。迄今为止，最初用于行为科学中参与者间可靠性研究的类内相关系数（ICC）已成为神经影像和功能近红外光谱（fNIRS）可靠性研究中的常用指标。然而，由于 ICC 有六种流行的形式，对 ICC 的全面理解是否充分将影响人们在可靠性研究中如何正确选择、使用和解释 ICC。我们首先在互检验可靠性评估的背景下，对 ICC 的统计原理进行简要回顾和教程，包括方差模型和技术定义的基础分析。其次，我们提供有关 ICC 选择和解释的一般准则。第三，我们通过使用实际研究评估基于 fNIRS 的体积扩散光学断层扫描的风险决策协议刺激的大脑活动的互测可靠性来说明所提出的方法。最后，讨论了使用ICC进行可靠性评估时可能出现的特殊问题并提出了解决方案。 (C) 2015 年光电仪器工程师学会 (SPIE)
Test-retest reliability of neuroimaging measurements is an important concern in the investigation of cognitive functions in the human brain. To date, intraclass correlation coefficients (ICCs), originally used in interrater reliability studies in behavioral sciences, have become commonly used metrics in reliability studies on neuroimaging and functional near-infrared spectroscopy (fNIRS). However, as there are six popular forms of ICC, the adequateness of the comprehensive understanding of ICCs will affect how one may appropriately select, use, and interpret ICCs toward a reliability study. We first offer a brief review and tutorial on the statistical rationale of ICCs, including their underlying analysis of variance models and technical definitions, in the context of assessment on intertest reliability. Second, we provide general guidelines on the selection and interpretation of ICCs. Third, we illustrate the proposed approach by using an actual research study to assess intertest reliability of fNIRS-based, volumetric diffuse optical tomography of brain activities stimulated by a risk decision-making protocol. Last, special issues that may arise in reliability assessment using ICCs are discussed and solutions are suggested. (C) 2015 Society of Photo-Optical Instrumentation Engineers (SPIE)