Strong in-plane birefringence of spatially nanostructured silicon
Strong in-plane birefringence of spatially nanostructured silicon
复制标题
空间纳米结构硅的强面内双折射
DOI：
--
复制
发表时间：
2001
期刊：
影响因子：
--
通讯作者：
F. Koch
中科院分区：
文献类型：
--
作者：
D. Kovalev;G. Polisski;J. Diener;H. Heckler;N. Künzner;V. Timoshenko;F. Koch
我们报告了一个强大的内在的光学各向异性的硅诱导其介电图案。结果发现，纳米结构（110）Si表面的面内双折射比体硅晶体中观察到的强104倍。我们发现双折射的值强烈依赖于组装这些层的硅纳米颗粒的电介质周围。除了实现光学器件和传感器的许多潜在影响之外，这为在介观几何尺度上研究凝聚现象的物理学提供了有利的途径。
We report on a strong intrinsic optical anisotropy of Si induced by its dielectric patterning. As a result, an in-plane birefringence for nanostructured (110) Si surfaces is found to be 104 times stronger than that observed in bulk silicon crystals. We found the value of birefringence to be strongly dependent on the dielectric surrounding of the silicon nanoparticles assembling these layers. Beyond numerous potential implications for realization of optical devices and sensors, this gives a favorable route for studying the physics of condensation phenomena in a mesoscopic geometrical scale.