High-temperature electromechanical loss in piezoelectric langasite and catangasite crystals
High-temperature electromechanical loss in piezoelectric langasite and catangasite crystals
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DOI：
10.1063/5.0058751
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发表时间：
2021-08
影响因子：
3.2
通讯作者：
Y. Suhak;H. Fritze;A. Sotnikov;H. Schmidt;W. Johnson
中科院分区：
文献类型：
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作者：
Y. Suhak;H. Fritze;A. Sotnikov;H. Schmidt;W. Johnson
本文研究了部分无序的硅酸镧镧（LGS，La 3Ga 5SiO 14）和有序的钙钛矿（CTGS，Ca 3 TaGa 3Si 2 O 14）晶体中随温度变化的声损耗Q−1，并与先前报道的CTGS和硅酸镧（LGT，La3Ga5.5Ta0.5O14）数据进行了比较。两个独立的技术，一个非接触式的音爆激励技术和接触谐振压电光谱，在这项研究中使用。通过拟合基于物理的函数来确定对测量的Q−1（T）的贡献，并讨论了提取的拟合参数，包括过程的活化能。结果表明，在LGS和CTGS中的损失是由几种机制的叠加，包括固有的声子-声子损失，点缺陷弛豫，和电导相关的弛豫。
Temperature-dependent acoustic loss Q−1 is studied in partially disordered langasite (LGS, La3Ga5SiO14) and ordered catangasite (CTGS, Ca3TaGa3Si2O14) crystals and compared with previously reported CTGS and langatate (LGT, La3Ga5.5Ta0.5O14) data. Two independent techniques, a contactless tone-burst excitation technique and contacting resonant piezoelectric spectroscopy, are used in this study. Contributions to the measured Q−1(T) are determined through fitting to physics-based functions, and the extracted fit parameters, including the activation energies of the processes, are discussed. It is shown that losses in LGS and CTGS are caused by a superposition of several mechanisms, including intrinsic phonon–phonon loss, point-defect relaxations, and conductivity-related relaxations.