Residual Stress Analysis by X‐Ray Diffraction Methods
Residual Stress Analysis by X‐Ray Diffraction Methods
复制标题
X 射线衍射法残余应力分析
DOI：
10.1002/9783527649884.ch5
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发表时间：
2013
期刊：
影响因子：
--
通讯作者：
M. Klaus
中科院分区：
文献类型：
--
作者：
C. Genzel;I. Denks;M. Klaus
由于制造和随后的热、化学和/或机械表面处理，如表面硬化、氮化、研磨、喷丸或表面涂层，技术零件和组件中不可避免地存在残余应力，因此在设计产品的机械性能时必须考虑这些应力。目前，公知的是，通过所谓的残余应力工程，甚至在生产过程本身中，残余应力可以关于它们在材料内的量和分布进行定制。然而，设计残余应力状态（例如，在工具的高应力近表面区域）以增加其使用寿命需要适当的分析。残余应力不能直接测量，只能通过其对材料的影响（以应变的形式产生）来确定。在多晶材料，这是考虑在本章中，衍射方法允许一个直接的，非破坏性的，相位选择性测量的晶格间距的基础上布拉格定律。因此，它们在分析不同长度尺度和试样表面以下不同深度的残余应力分布中占有关键地位。原则上，所有三种辐射，即光子、电子和中子，都可以用于衍射应力分析。然而，由于合适的辐射源的可用性和方法的多功能性的原因，X射线衍射在无损残余应力分析领域中占据主导地位。
Owing to manufacturing and subsequent thermal, chemical, and/or mechanical surface treatment such as case hardening, nitriding, grinding, shot peening, or coating of surfaces, residual stresses are inevitable in technical parts and components and it is vital that they are considered when designing the mechanical properties of the products. At present, it is well known that residual stresses can be tailored with respect to their amount and distribution within the material even in the production process itself by means of what may be called residual stress engineering. However, designing the residual stress state, for example, in the highly stressed near-surface zone of tools in order to increase their lifetime, requires appropriate analysis.Residual stresses cannot be measured directly but only be determined by their impact on the material in the form of strain resulting from them. In polycrystalline materials, which are considered in this chapter, diffraction methods allow for a direct, nondestructive, phase-selective measurement of the lattice spacings based on Bragg’s law. Therefore, they take up a key position for analyzing residual stress distributions on different length scales and in different depths below the sample surface. In principle, all three kinds of radiation, that is, photons, electrons, and neutrons, can be used for diffraction stress analysis. However, for reasons of availability of appropriate radiation sources and of the versatility of the methods, X-ray diffraction occupies the leading position in the field of nondestructive residual stress analysis.