Schottky barriers and Coulomb blockade in self-assembled carbon nanotube FETs
Schottky barriers and Coulomb blockade in self-assembled carbon nanotube FETs
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DOI:
10.1021/nl0342848
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发表时间:
2003-08-01
期刊:
影响因子:
10.8
通讯作者:
Bonnot, AM
中科院分区:
文献类型:
--
作者:
Marty, L;Bouchiat, V;Bonnot, AM
We report low-temperature electronic transport in batch-processed single-walled carbon nanotube (SWNT) field-effect transistors (FETs). SWNTs are in situ synthesized and wired between submicrometer metallic electrodes in a single-step process involving hot-filament-assisted chemical vapor deposition. FETs show a pronounced ambipolar field effect between 1 and 300 K. Moreover, the gate dependence exhibits hysteresis at any temperature because of the extraction and trapping of charges. We find Schottky barriers at the SWNT/metal contact to be responsible for the field effect. Below 30 K, potential barriers along the SWNT induce a Coulomb blockade at low drain-source bias, leading to the suppression of the field-effect gain and inducing fluctuations in the transconductance.