Focused ion beam deposited carbon-platinum nanowires for cryogenic resistive thermometry
Focused ion beam deposited carbon-platinum nanowires for cryogenic resistive thermometry
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DOI:
10.1016/j.carbon.2020.06.087
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发表时间:
2020-11-01
期刊:
影响因子:
10.9
通讯作者:
Singh, Meenakshi
中科院分区:
文献类型:
--
作者:
Blagg, Kirsten;Allen, Portia;Singh, Meenakshi
The study of thermal effects, both classical and quantum, at cryogenic temperatures requires the use of on-chip, local, high-sensitivity thermometry. Carbon-platinum composites fabricated using focused ion beam (FIB) assisted deposition form a granular structure which is shown in this study to be uniquely suited for this application. Carbon-platinum thermometers deposited using a 24 pA ion beam current have high sensitivities below 1 K, comparable to the best cryogenic thermometers. In addition, these thermometers can be accurately placed to within 10s of nanometers on the chip using a mask-free process. They also have a weak magnetic field dependence, < 3% change in resistance with applied magnetic fields from 0 to 8 T. Finally, these thermometers are integrable into a variety of nanoscale devices due to the existing wide spread use of FIB. (C) 2020 Elsevier Ltd. All rights reserved.