X-ray analyzer-based phase-contrast computed laminography.
X-ray analyzer-based phase-contrast computed laminography.
复制标题
基于 X 射线分析仪的相衬计算机断层摄影。
DOI：
--
复制
发表时间：
2016
影响因子：
2.5
通讯作者：
M. Kimura
中科院分区：
文献类型：
--
作者：
K. Hirano;Y. Takahashi;K. Hyodo;M. Kimura
基于 X 射线分析仪的相衬成像与计算机断层扫描相结合，可对吸收对比度较弱的横向延伸的扁平样本中的感兴趣区域进行成像。这里讨论的光学器件由一个不对称切割的准直器晶体和一个以非色散（+、-）衍射几何排列的对称切割的分析器晶体组成。给出了计算样品的多对比度（吸收、折射和相差）图像的通用算法。还提出了用于分层重建的基本公式。该方法的可行性在光子工厂的垂直摆动光束线BL-14B上得到了验证。在0.0733nm波长下，成功获得了塑料珠的相差截面图像。由于样品架造成强烈的圆形伪影，视野直径被限制在约 6 mm。
X-ray analyzer-based phase-contrast imaging is combined with computed laminography for imaging regions of interest in laterally extended flat specimens of weak absorption contrast. The optics discussed here consist of an asymmetrically cut collimator crystal and a symmetrically cut analyzer crystal arranged in a nondispersive (+, -) diffraction geometry. A generalized algorithm is given for calculating multi-contrast (absorption, refraction and phase contrast) images of a sample. Basic formulae are also presented for laminographic reconstruction. The feasibility of the method discussed was verified at the vertical wiggler beamline BL-14B of the Photon Factory. At a wavelength of 0.0733 nm, phase-contrast sectional images of plastic beads were successfully obtained. Owing to strong circular artifacts caused by a sample holder, the field of view was limited to about 6 mm in diameter.