Extracting the interfacial free energy and anisotropy from a smooth fluctuating dividing surface

Extracting the interfacial free energy and anisotropy from a smooth fluctuating dividing surface
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从平滑波动的分界面中提取界面自由能和各向异性

DOI:
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发表时间:
2017
期刊:
Journal of Physics: Condensed Matter
影响因子:
--
通讯作者:
G. A. Tribello
G. A. Tribello
中科院分区:
--
文献类型:
--
作者:
E. Baldi;M. Ceriotti;G. A. Tribello

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不同材料和相之间的界面在许多物理和化学现象中起着至关重要的作用。然而,当在原子尺度上对物质进行模拟时,描述这些界面的特征往往并不是一件微不足道的事情,特别是当它们是粗糙或扩散的时候。在这里,我们讨论Willard和Chandler的一个结构的推广,它允许人们获得一个光滑的分割面,该分割面遵循这些波动界面的不规则、不断变化的形状。我们展示了如何使用这种结构来研究将固体材料与其熔体分离的表面,以及如何对这种瞬时分离表面的毛细血管起伏进行傅立叶模式分析。这种特殊的分析是有用的,因为人们可以从傅立叶模的平均幅度计算界面的比自由能过剩,以及它与取向相对于主体相的依赖关系。因此,我们从系统规模和统计抽样两个方面讨论了这种方法的效率。
Interfaces between different materials and phases play a crucial role in many physical and chemical phenomena. When performing simulations of matter at the atomic scale, however, it is often not trivial to characterize these interfaces, particularly when they are rough or diffuse. Here we discuss a generalization of a construction, due to Willard and Chandler, that allows one to obtain a smooth dividing surface that follows the irregular, ever changing shape of these fluctuating interfaces. We show how this construction can be used to study the surface that separates a solid material from its melt and how analyses of the Fourier modes for the capillary fluctuations of this instantaneous dividing surface can be performed. This particular analysis is useful as one can compute the specific free energy excess of the interface, and its dependence on orientation relative to the bulk phases, from the average amplitude of the Fourier modes. We therefore discuss the efficiency of this approach, both in terms of system size and statistical sampling.
DOI: 10.1021/jp909219k
发表时间: 2010-02-11
期刊: The journal of physical chemistry. B
影响因子: --
作者:
Willard AP;Chandler D
通讯作者: Chandler D
DOI: 10.1103/physrevb.81.125416
发表时间: 2010-03-01
期刊: PHYSICAL REVIEW B
影响因子: 3.7
作者:
Angioletti-Uberti, Stefano;Ceriotti, Michele;Finnis, Mike W.
通讯作者: Finnis, Mike W.