Fully low voltage and large area searching scanning tunneling microscope
Fully low voltage and large area searching scanning tunneling microscope
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全低压大面积搜索扫描隧道显微镜
DOI：
10.1088/0957-0233/20/6/065503
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发表时间：
2009-06-01
影响因子：
2.4
通讯作者：
Lu, Qingyou
中科院分区：
文献类型：
--
作者：
Pang, Zongqiang;Wang, Jihui;Lu, Qingyou
我们展示了一种新型扫描隧道显微镜（STM），它能使针尖在样品上移动较大距离（毫米级），并且在其所能到达的任何位置拍摄图像（以找到微观目标），同时不会损失原子分辨率。这种大范围的搜索能力，以及粗调接近和扫描运动，全部仅由一个压电管扫描器完成，并且仅使用低电压（
We present a novel scanning tunneling microscope (STM), which allows the tip to travel a large distance (millimeters) on the sample and take images (to find microscopic targets) anywhere it reaches without losing atomic resolution. This broad range searching capability, together with the coarse approach and scan motion, is all done with only one single piezoelectric tube scanner as well as with only low voltages (<15 V). Simple structure, low interference and high precision are thus achieved. To this end, a pillar and a tube scanner are mounted in parallel on a base with one ball glued on the pillar top and two balls glued on the scanner top. These three balls form a narrow triangle, which supports a triangular slider piece. By inertial stepping, the scanner can move the slider toward the pillar (coarse approach) or rotate the slider about the pillar (travel along sample surface). Since all the stepping motions are driven by the scanner's lateral bending which is large per unit voltage, high voltages are unnecessary. The technology is also applicable to scanning force microscopes (SFM) such as atomic force microscopes (AFM), etc.