Bound Excitons in Semiconductors
Bound Excitons in Semiconductors
复制标题
半导体中的束缚激子
DOI:
10.1007/978-3-642-81368-9_3
复制
发表时间:
1979
影响因子:
3.7
通讯作者:
D. Herbert
中科院分区:
文献类型:
--
作者:
P. J. Dean;D. Herbert
We have attempted a comprehensive account of the nature and properties of bound excitons (BE) in semiconductors. We have not attempted to give a comprehensive survey of the properties of BE in all semiconductors where these effects have been reliably identified. Such attempts are foredoomed to failure other than in a text of encyclopaedic dimension. Rather, we consider the main characteristics of BE and the essential information they provide both on the nature of the host semiconductor and of the impurity or defect at which the exciton is localised. The essential properties are illustrated by reference to systems selected sometimes for reasons associated with the historical development of the subject since its genesis in the mid 1950s, sometimes because of the particular clarity of properties in the chosen system and sometimes, we hope not excessively frequently, because of the prejudices of the present authors.
DOI:
--
发表时间:
2019
期刊:
影响因子:
--
作者:
森川響二朗;竹内智章;北森武彦;西川浩矢
通讯作者:
西川浩矢
影响因子:
--
作者:
J. Merz;R. A. Faulkner;P. J. Dean
通讯作者:
J. Merz;R. A. Faulkner;P. J. Dean