POLYHEDRAL AND CYLINDRICAL STRUCTURES OF TUNGSTEN DISULFIDE

POLYHEDRAL AND CYLINDRICAL STRUCTURES OF TUNGSTEN DISULFIDE
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DOI:
10.1038/360444a0
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发表时间:
1992-12-03
期刊:
影响因子:
64.8
通讯作者:
HODES, G
HODES, G
中科院分区:
综合性期刊1区
文献类型:
--
作者:
TENNE, R;MARGULIS, L;HODES, G

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在发现C60之后(参考文献1)和富勒烯化学的出现,人们对相关的柱状2,3和多面体4,5形式的石墨给予了相当大的关注。然而,到目前为止,对这种封闭结构的观察仅限于碳系统。在这里,我们报道了层状半导体二硫化钨中等效稳定结构的形成。在硫化氢气氛中加热钨薄膜后,透射电子显微镜显示从非晶态钨基质中生长出各种同心的多面体和圆柱体结构(尺寸从<10到>100 nm)。通过电子衍射和晶格成像验证了结构的封闭性。与TH,碳系一样,要完全封闭二硫化钨,需要存在结构缺陷(例如,边缘位错),或者原子在多面体中的排列,而不是平面六角几何。
FOLLOWING the discovery of C60 (ref. 1) and the advent of fullerene chemistry, considerable attention has been directed towards the associated cylindrical2,3 and polyhedral4,5 forms of graphite. To date, however, observations of such closed structures have been limited to the carbon system. Here we report the formation of equivalent stable structures in the layered semiconductor tungsten disulphide. After the heating of thin tungsten films in an atmosphere of hydrogen sulphide, transmission electron microscopy reveals a variety of concentric polyhedral and cylindrical structures (ranging in size from < 10 to > 100 nm) growing from the amorphous tungsten matrix. The closed nature of the structures is verified by electron diffraction and lattice imaging. As with th, carbon system, complete closure of the tungsten disulphide layers requires the presence of structural defects (for example, edge dislocations), or the arrangement of atoms in polyhedra other than a planar hexagonal geometry.