Electron interference: mystery and reality
Electron interference: mystery and reality
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DOI：
10.1098/rsta.2001.0973
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发表时间：
2002-05-15
期刊：
影响因子：
5
通讯作者：
Lichte, H
中科院分区：
文献类型：
--
作者：
Lichte, H
Interference of electron waves has developed from a fascinating phenomenon in basic physics to a key method for the highly sophisticated investigation of both electric and magnetic structures in solid-state materials. After more than 20 years of development, electron holography in the transmission electron microscope is now a very powerful technique for the analysis of micro-fields down to atomic dimensions. The applications extend from highly sensitive measurements in semiconductor technology to the quantitative characterization of atomic structures.
