Static and Dynamic Obfuscations of Scan Data Against Scan-Based Side-Channel Attacks

Static and Dynamic Obfuscations of Scan Data Against Scan-Based Side-Channel Attacks
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针对基于扫描的侧通道攻击的扫描数据的静态和动态混淆

DOI:
10.1109/tifs.2016.2613847
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发表时间:
2017-02-01
影响因子:
6.8
通讯作者:
Chang, Chip-Hong
Chang, Chip-Hong
中科院分区:
计算机科学1区
文献类型:
--
作者:
Cui, Aijiao;Luo, Yanhui;Chang, Chip-Hong

文献摘要

被引文献

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由于高级集成电路(IC)制造过程的谬误性,密码IC已广泛使用扫描测试来提供高故障覆盖范围。扫描设计提供的完全可控性和可观察性也打开了侧驱动攻击的陷阱门。为了更好地抵抗对可扫描测试的cryptochip的签名攻击,我们建议通过静态混淆扫描数据来强化密钥和锁定方法。当使用不正确的测试键执行扫描测试时,某些扫描单元的工作模式没有在空间上重新装修扫描单元,而是会弄乱扫描数据。但是,当直接通过主要输入以实现测试效率供应明文时,扫描数据的静态混淆是不足的,如本文提出的新的仅测试模式签名攻击(TMOSA)所证明的那样。对于Treat Tmosa来说,提出了基于扫描数据的动态混淆的新对策。通过在整个测试阶段周期性移动不正确的测试键,由于测试键的不匹配位而引起的封闭单元格被暂时移动以动态混淆扫描数据。后一种方案无条件地抵御TMOSA和所有其他已知的基于扫描的攻击,同时保留了与其他对策相比,保持高可测试性和低面积的头顶的优点。
Due to the fallibility of advanced integrated circuit (IC) fabrication processes, scan test has been widely used by cryptographic ICs to provide high fault coverage. Full controllability and observability offered by the scan design also open out the trapdoor to side-channel attacks. To better resist signature attacks on scan testable cryptochip, we propose to fortify the key and lock method by the static obfuscation of scan data. Instead of spatially reshuffling the scan cells, the working mode of some scan cells is altered to jumble up the scan data when the scan test is performed with an incorrect test key. However, when the plaintext is fed directly through the primary inputs for test efficiency, the static obfuscation of scan data is inadequate as demonstrated by a new test-mode-only signature attack (TMOSA) proposed in this paper. To thwart TMOSA, a new countermeasure based on the dynamic obfuscation of scan data is proposed. By cyclically shifting the incorrect test key throughout the test phase, the blocking cells due to the mismatched bits of the test key are made to move temporally to dynamically obfuscate the scan data. This latter scheme is unconditionally resilient against TMOSA and all other known scan-based attacks while preserving the merits of high testability and low area overhead compared with other countermeasures.