Optimising variability tolerant standard cell libraries
Optimising variability tolerant standard cell libraries
复制标题
优化可变性耐受的标准细胞库
DOI：
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发表时间：
2009
期刊：
影响因子：
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通讯作者：
A. Tyrrell
中科院分区：
文献类型：
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作者：
J. Hilder;James Alfred Walker;A. Tyrrell
本文描述了一种在标准单元库中优化晶体管尺寸的方法。目标是提取高速、低功耗电路，这些电路能够更耐受未来技术节点中普遍存在的随机波动。遗传算法使用基于 3D 原子模拟的统计增强型 SPICE 模型，利用多目标适应度函数来优化电路内的器件宽度。结果表明，可以通过优化晶体管宽度来减少阈值电压变化的影响，并表明可以将类似的方法扩展到更大电路的优化。
This paper describes an approach to optimise transistor dimensions within a standard cell library. The goal is to extract high-speed and low-power circuits which are more tolerant to the random fluctuations that will be prevalent in future technology nodes. Using statistically enhanced SPICE models based on 3D-atomistic simulations, a Genetic Algorithm optimises the device widths within a circuit using a multi-objective fitness function. The results show the impact of threshold voltage variation can be reduced by optimising transistor widths, and suggest a similar method could be extended to the optimisation of larger circuits.