Autocollimating detectors of birefringence
Autocollimating detectors of birefringence
复制标题
自准直双折射探测器
DOI：
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发表时间：
1996
期刊：
影响因子：
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通讯作者：
M. Shribak
中科院分区：
文献类型：
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作者：
M. Shribak
本文介绍了用光度法、平衡法、补偿法和干涉法测量正反射双折射的装置。该方案可用于研究光盘的光学各向异性、透明固体的内应力、晶体的双折射以及温度、压力、电场和磁场强度的测量。
The paper describes the devices for measuring the normal- reflection birefringence with using of the photometric, balanced, compensation and interferometric methods. The suggested scheme may be used for research of optical anisotropy in optical recording disks, inner stress in transparent solid body, birefringence of crystals and for the measuring of temperature, pressure, electrical and magnetic field strength.