Attenuation of spectral interferences during laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS) using an rf only collision and reaction

Attenuation of spectral interferences during laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS) using an rf only collision and reaction
复制标题

DOI:
10.1039/b202964b
复制
发表时间:
2002-01-01
影响因子:
3.4
通讯作者:
Kraan, WJ
Kraan, WJ
中科院分区:
化学2区
文献类型:
--
作者:
Mason, PRD;Kraan, WJ

文献摘要

被引文献

相似文献

研究了激光烧蚀电感耦合等离子体质谱(LICMS)中光谱干扰的抑制。在激光烧蚀实验中,用H-2对基于Ar+的多原子离子(ARX+)衰减1-6个数量级,而在相同参数下分析物的透过率保持在80%以上。对于固定体积的活性氢气,ArX+的衰减量与母体元素X的电负性成正比。He对干扰没有显著的减弱作用。然而,在等离子体中从“干”到“湿”的变化导致了与电池中的水分子的反应,从而对清洁的氦缓冲气体具有明显的反应性,同时降低了与H-2的某些反应的效率。由于背景干扰的减少,在优化的条件下分析硫化物和碳酸盐标准物质中的痕量元素,提高了准确度和精密度。反应池中的反应气体可以进行多元素分析,准确的分析结果表明,大多数痕量元素的推荐值都在15%以内,候选玻璃标准物质可以使用NIST SRM玻璃进行校准。
The reduction of spectral interferences in laser ablation inductively coupled plasma mass spectrometry was investigated using an rf only hexapole as a collision and reaction cell with H-2 as the reaction gas and He as a buffer gas. Argon-based polyatomic ions (ArX+) were attenuated by between 1 and 6 orders of magnitude with H-2 during laser ablation experiments whilst analyte transmission under the same parameters was maintained above 80%. The amount of ArX+ attenuation for a fixed volume of reactive H-2 gas was proportional to the electronegativity of parent element X. Interferences were not significantly attenuated with He. However, a change from 'dry' to `wet' conditions in the plasma led to reactions with water molecules in the cell giving an apparent reactivity for clean He buffer gas whilst reducing the efficiency of some reactions with H-2. Improved accuracy and precision were demonstrated under optimised conditions for the analysis of trace elements in sulfide and carbonate standard reference materials as a result of background interference reduction. Multi-element analysis was possible with reactive gases in the reaction cell as demonstrated by the accurate analysis, to within 15% of the recommended values for most trace elements, of candidate glass reference materials using NIST SRM glasses for calibration.