Reply to 'Comment on 'Electron-induced bond breaking at low energies in HCOOH and glycine: The role of very short-lived {sigma}* anion states''
Reply to 'Comment on 'Electron-induced bond breaking at low energies in HCOOH and glycine: The role of very short-lived {sigma}* anion states''
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回复“对 HCOOH 和甘氨酸中低能电子诱导键断裂的评论：非常短命的 {sigma}* 阴离子态的作用”
DOI：
10.1103/physreva.80.046702
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发表时间：
2009
影响因子：
2.9
通讯作者：
I. Fabrikant
中科院分区：
文献类型：
--
作者：
G. Gallup;P. Burrow;I. Fabrikant
Rescigno等人[Phys. Rev. A80，046701（2009）]批评了我们对甲酸中解离电子附着的理论处理，其中我们表明该过程可以通过电子附着到由{sigma}*（OH）轨道占据形成的临时负离子状态来解释。我们认为他们的反对意见经不起推敲。
Rescigno et al. [Phys. Rev. A80, 046701 (2009)] criticized our theoretical treatment of dissociative electron attachment in formic acid in which we show that this process can be explained by electron attachment into the temporary negative ion state formed by occupation of the {sigma}*(OH) orbital. We argue that their objections do not hold up to scrutiny.