Photoabsorption cross sections of H2, D2, N2, O2, Ar, Kr, and Xe at the 584‐A line of neutral helium
Photoabsorption cross sections of H2, D2, N2, O2, Ar, Kr, and Xe at the 584‐A line of neutral helium
复制标题
H2、D2、N2、O2、Ar、Kr 和 Xe 在中性氦 584-A 线处的光吸收截面
DOI：
10.1029/ja078i010p01627
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发表时间：
1973
影响因子：
--
通讯作者：
J. C. Fong
中科院分区：
文献类型：
--
作者：
J. Brolley;L. Porter;R. Sherman;J. Theobald;J. C. Fong
菲利普斯电离规氦放电已被用来提供稳定的真空紫外光量子源。用串联的TiN薄膜过滤紫外光，将光谱降低到基本上584-A的氦线。目标气体对584-A辐射的吸收是在带有水杨酸钠检测器的无窗小室中观察到的。利用MKS Baratron实现了吸收塔气体压力的精确测量。在本实验中测量的光吸收截面的准确度约为2%，与其他人最近报道的值基本一致。
A Phillips ionization gage helium discharge has been used to provide a stable source of vacuum ultraviolet photons. Filtration of the ultraviolet beam with tandem tin films reduced the spectrum to substantially the 584-A line of helium. Absorption by target gases of the 584-A radiation was observed in a windowless cell with a sodium salicylate detector. Precise absorber gas pressure measurement was achieved with an MKS Baratron. Photoabsorption cross sections, which were determined in this experiment with an accuracy of about 2%, are in essential agreement with values recently reported by others.