Electric-field-induced soft-mode hardening in SrTiO3 films
Electric-field-induced soft-mode hardening in SrTiO3 films
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DOI：
10.1103/physrevlett.84.4625
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发表时间：
2000-05-15
影响因子：
8.6
通讯作者：
Xi, XX
中科院分区：
文献类型：
--
作者：
Akimov, IA;Sirenko, AA;Xi, XX
We have studied electric-field-induced Raman scattering in SrTiO3 thin films using an indium-tin-oxide/SrTiO3/SrRuO3 structure grown by pulsed laser deposition. The soft mode polarized along the field becomes Raman active. Experimental data for electric-field-induced hardening of the soft modes and the tuning of the static dielectric. constant are in agreement described by the Lyddane-Sachs-Teller formalism. The markedly different behavior of the soft modes in thin films from that in the bulk is explained by the existence of local polar regions.
