All-optical control and metrology of electron pulses
All-optical control and metrology of electron pulses
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DOI：
10.1126/science.aae0003
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发表时间：
2016-04-22
期刊：
影响因子：
56.9
通讯作者：
Baum, P.
中科院分区：
文献类型：
--
作者：
Kealhofer, C.;Schneider, W.;Baum, P.
短电子脉冲是时间分辨原子尺度衍射和电子显微镜、条纹相机和自由电子激光器的核心。我们展示了相空间控制和表征5皮米电子脉冲使用几个周期的太赫兹辐射，微波电子脉冲压缩和条纹的概念扩展到太赫兹频率。电子脉冲的光场控制提供了与激光脉冲的同步，并提供了最终受所施加的光场的上升时间限制的时间分辨率。我们使用0.3太赫兹的几个周期波形将电子脉冲压缩12倍，时间稳定性为
Short electron pulses are central to time-resolved atomic-scale diffraction and electron microscopy, streak cameras, and free-electron lasers. We demonstrate phase-space control and characterization of 5-picometer electron pulses using few-cycle terahertz radiation, extending concepts of microwave electron pulse compression and streaking to terahertz frequencies. Optical-field control of electron pulses provides synchronism to laser pulses and offers a temporal resolution that is ultimately limited by the rise-time of the optical fields applied. We used few-cycle waveforms carried at 0.3 terahertz to compress electron pulses by a factor of 12 with a timing stability of