Leakage current reduction by thermal oxidation in Ni/Au Schottky contacts on lattice-matched In0.18Al0.82N/GaN heterostructures
Leakage current reduction by thermal oxidation in Ni/Au Schottky contacts on lattice-matched In0.18Al0.82N/GaN heterostructures
复制标题
通过热氧化减少晶格匹配 In0.18Al0.82N/GaN 异质结构上 Ni/Au 肖特基接触的漏电流
DOI：
10.1088/1674-1056/23/3/037303
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发表时间：
2014
影响因子：
1.7
通讯作者：
Wei Ke
中科院分区：
文献类型：
--
作者：
Lu Li-Wu;Xu Fu-Jun;Liu Xin-Yu;Wei Ke
By using temperature-dependent current—voltage, variable-frequency capacitance-voltage, and Hall measurements, the effects of the thermal oxidation on the electrical properties of Ni/Au Schottky contacts on lattice-matched In0.18Al0.82N/GaN heterostructur
