A line current method, a theory of measurement of anisotropic resistivity, and a really exact universal correction function
A line current method, a theory of measurement of anisotropic resistivity, and a really exact universal correction function
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线电流法、各向异性电阻率测量理论、真正精确的通用校正函数
DOI：
10.1088/0953-2048/21/11/115005
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发表时间：
2008-11
影响因子：
3.6
通讯作者：
Dai, JiXin
中科院分区：
文献类型：
--
作者：
Dai, Xianxi;He, Y.;Xiang, X.;Dai, JiXin
电阻率，特别是各向异性电阻率，在许多材料中都是一个有趣的特性。本文提出了一种线电流法（LC）。对于大晶体样品，用LC法获得其电阻率张量的所有分量没有困难。然而，在薄膜的垂直方向上测量分量是困难的，必须进行三次独立的测量。对于给定的薄膜，对于LC方法，只能有两种独立的探针结构设计。本文提出了一种基于两种取向的薄膜测量各向异性晶体电阻率的理论，该理论可应用于高tc超导体或半导体的薄膜和体。通过在晶体上布置探针，解决了测量中某些元件不敏感的问题。该方法具有广泛的应用价值，并在实际应用中得到了用复合初等函数表示的精确的通用修正函数。
Resistivity, especially anisotropic resistivity, is an interesting property in many materials. In this paper a line current (LC) method is presented. For large crystal samples, there is no difficulty in obtaining all components of their resistivity tensors by this LC method. However, it is difficult to measure the component in the vertical direction of thin films and one must make three independent measurements. For a given thin film, for the LC method, one can have only two independent designs for the probe configurations. In this paper, a theory for measuring the resistivity of anisotropic crystals based on two films with two orientations is proposed, which can be applied to films and bulk of high-Tc superconductors or semiconductors. The insensitivity of certain components in the measurement is solved through the arrangement of probes on the crystal. The method can be widely applied, and an exact universal correction function in practice, expressed by composite elementary functions, is obtained.
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影响因子：
1.3
作者：
P. B. Abramyan;A. M. Gulyan;A. Kuzanyan;A. Petrosyan;M. L. Ter-mikaelyan;G. Shirinyan
通讯作者：
P. B. Abramyan;A. M. Gulyan;A. Kuzanyan;A. Petrosyan;M. L. Ter-mikaelyan;G. Shirinyan
影响因子：
8.6
作者：
S. Martin;A. Fiory;R. Fleming;L. Schneemeyer;J. Waszczak
通讯作者：
S. Martin;A. Fiory;R. Fleming;L. Schneemeyer;J. Waszczak
DOI：
10.1007/bf01303701
发表时间：
1986-01-01
期刊：
ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER
影响因子：
--
作者：
BEDNORZ, JG;MULLER, KA
通讯作者：
MULLER, KA
影响因子：
8.6
作者：
G. Briceno;M. Crommie;A. Zettl
通讯作者：
G. Briceno;M. Crommie;A. Zettl
影响因子：
64.8
作者：
Y. Hidaka;M. Suzuki
通讯作者：
Y. Hidaka;M. Suzuki