Investigation of methods to enhance the secondary ion yields in TOF-SIMS of organic samples
Investigation of methods to enhance the secondary ion yields in TOF-SIMS of organic samples
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DOI：
10.1002/sia.2810
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发表时间：
2008-03-01
影响因子：
1.7
通讯作者：
Arlinghaus, H. F.
中科院分区：
文献类型：
--
作者：
Heile, A.;Lipinsky, D.;Arlinghaus, H. F.
除了结构信息，详细了解当地的化学环境被证明是越来越重要的，例如开发新类型的材料，以及在材料科学的多个领域，或各种生物医学和化学应用的表面和界面的具体修改。但是，由于微型化的不断发展，可用于分析的物质的数量不断减少，这对分析方法的检测限提出了挑战。在飞行时间二次离子质谱（TOF-SIMS）中，已经提出了几种提高二次离子产额的方法。本文重点研究了其中两种方法，金属辅助二次离子质谱和多原子原离子轰击的影响。为此目的，使用单原子（Ar+、Ga+、Ga+、Bi+）和多原子（SF 5+、Bi-3（+）、C-60（+））Pis分析了较厚的有机分子（聚合物和染料）层，无论是原始的还是用不同量的金金属化的。结果发现，多原子离子通常会引起显着增加的二次离子产额。另一方面，与金沉积，产量提高只能检测到单原子离子轰击。版权所有（c）2008约翰威利父子有限公司。
In addition to structural information, detailed knowledge of the local chemical environment proves to be of ever greater importance, for example for the development of new types of materials as well as for specific modifications of surfaces and interfaces in multiple fields of materials science, or various biomedical and chemical applications. But the ongoing miniaturization, and therefore, reduction of the amount of material available for analysis constitute a challenge to the detection limits of analytical methods.In the case of time-of-flight secondary ion mass spectrometry (TOF-SIMS), several methods of secondaryion yield enhancement have been proposed. This article focuses on the investigation of the effects of two of these methods, metal-assisted SIMS and polyatomic primary ion (PI) bombardment. For this purpose, thicker layers of organic molecules (polymers and dyes), both pristine, and metallized with different amounts of gold, were analyzed using monoatomic (Ar+, Ga+, Xe+, Bi+) and polyatomic (SF5+, Bi-3(+), C-60(+)) Pis. It was found that polyatomic ions generally induce a significant increase of the secondary ion yield. On the other hand, with gold deposition, a yield enhancement can only be detected for monoatomic ion bombardment. Copyright (c) 2008 John Wiley & Sons, Ltd.