Tadahiro Shibutani, Takayuki Kitamura et.al: "Fracture of LSI conductor with Grain Boundary Network under Migration Induced by Electric Current and Stress" Preprint of 4^<th> National Symposium on Atom Migration in LSI Conductor. 33-34 (1998)
Tadahiro Shibutani, Takayuki Kitamura et.al: "Fracture of LSI conductor with Grain Boundary Network under Migration Induced by Electric Current and Stress" Preprint of 4^<th> National Symposium on Atom Migration in LSI Conductor. 33-34 (1998)
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Tadahiro Shibutani、Takayuki Kitamura 等人：“电流和应力引起的迁移下具有晶界网络的 LSI 导体断裂”第四届全国 LSI 导体原子迁移研讨会预印本。
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