Evidence of a topological antiferromagnetic order on ultrathin Cr(001) film surface studied by spin-polarized scanning tunneling spectroscopy
Evidence of a topological antiferromagnetic order on ultrathin Cr(001) film surface studied by spin-polarized scanning tunneling spectroscopy
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DOI：
10.1063/1.1557352
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发表时间：
2003-05-15
影响因子：
3.2
通讯作者：
Koike, K
中科院分区：
文献类型：
--
作者：
Kawagoe, T;Suzuki, Y;Koike, K
利用自旋极化扫描隧道谱和镀Fe的W探针对在Au（001）薄膜上外延生长的Cr（001）薄膜的表面磁结构进行了成像。它示出，两步生长的4 nm厚的Cr层具有两个不同的生长温度的结果在化学清洁的表面，并使得有可能观察到不同的自旋对比度。室温下dI/dV信号的空间分辨图表明，Cr（001）薄膜表面的拓扑反铁磁有序结构是高密度台阶和螺旋位错的产物。(C)2003年，美国物理学会。
Imaging of the surface magnetic structure of Cr(001) films epitaxially grown on Au(001) film was performed by using spin-polarized scanning tunneling spectroscopy and Fe-coated W tips. It is shown that two-step growth of a 4-nm-thick Cr layer having two different growth temperatures results in a chemically clean surface and makes it possible to observe distinct spin contrast. The spatially resolved maps of dI/dV signals taken at room temperature indicated that the topological antiferromagnetic order on the thin Cr(001) film surface that is subject to high-density steps and screw dislocations. (C) 2003 American Institute of Physics.