Statistics of ion‐induced electron emission from a clean metal surface
Statistics of ion‐induced electron emission from a clean metal surface
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干净金属表面离子诱导电子发射的统计
DOI：
10.1063/1.1140546
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发表时间：
1989
影响因子：
1.6
通讯作者：
H. Winter
中科院分区：
文献类型：
--
作者：
G. Lakits;F. Aumayr;H. Winter
通过新颖的实验方法组合，通过测量总电子产率、喷射电子能量分布，特别是电子发射统计数据 (ES)，研究了用 (1-5 keV/amu) H+、H+2 和 H+3 轰击的干净多晶金的离子诱导电子发射。 ES 的评估包括对所应用的固态电子探测器表面的电子反向散射的校正。通过比较相同冲击速度的原子离子和分子离子的 ES，可以清楚地证明负分子效应。通过比较测得的分子离子冲击 ES 与由测得的 H+ 和 H+2 离子冲击 ES 分别合成的 ES，进一步研究了这种效应。对通过泊松和波利亚统计分布近似测量的 ES 的质量进行了详细研究，结果发现普遍不令人满意。
With a novel combination of experimental approaches, ion‐induced electron emission from clean polycrystalline gold bombarded with (1–5 keV/amu) H+, H+2, and H+3 has been studied by measuring total electron yields, ejected‐electron energy distributions, and, in particular, electron emission statistics (ES). Evaluation of ES included corrections for backscattering of electrons from the surface of the applied solid‐state electron detector. By comparing ES for atomic and molecular ions of equal impact velocities, a negative molecular effect could be clearly demonstrated. This effect was further investigated by comparing measured ES for molecular ion impact with ES synthesized from measured ES for H+ and H+2 ion impact, respectively. The quality of approximating measured ES by Poisson and Polya statistical distributions was investigated in detail and found to be generally unsatisfactory.