Characterisation of small embedded two-dimensional defects using multi-view Total Focusing Method imaging algorithm

Characterisation of small embedded two-dimensional defects using multi-view Total Focusing Method imaging algorithm
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DOI:
10.1016/j.ndteint.2021.102413
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发表时间:
2021-04
影响因子:
4.2
通讯作者:
Nicolas Budyn;A. Croxford;R. L. Bevan;J. Zhang;P. Wilcox
Nicolas Budyn;A. Croxford;R. L. Bevan;J. Zhang;P. Wilcox
中科院分区:
材料科学1区
文献类型:
--
作者:
Nicolas Budyn;A. Croxford;R. L. Bevan;J. Zhang;P. Wilcox

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