3D correlative morphological and elemental characterization of materials at the deep submicrometre scale
3D correlative morphological and elemental characterization of materials at the deep submicrometre scale
复制标题
深亚微米尺度材料的 3D 相关形态和元素表征
DOI:
10.1111/jmi.12458
复制
发表时间:
2016
影响因子:
2
通讯作者:
J. Barnes
中科院分区:
文献类型:
--
作者:
A. Priebe;G. Goret;Pierre Bleuet;G. Audoit;J. Laurencin;J. Barnes
This paper shows how X‐ray computed nanotomography (CNT) can be correlated with focused ion beam time‐of‐flight secondary ion mass spectrometry (FIB‐TOF‐SIMS) tomography on the same sample to investigate both the morphological and elemental structure. This methodology is applicable to relatively large specimens with dimensions of several tens of microns whilst maintaining a high spatial resolution of the order of 100 nm. However, combining X‐ray CNT and FIB‐TOF‐SIMS tomography requires innovative sample preparation protocols to allow both experiments to be conducted on exactly the same sample without chemically or structurally modifying the sample between measurements. Moreover, dedicated algorithms have been developed for effective data fusion that is biased with nine degrees of freedom. This methodology has been tested using a porous and heterogeneous solid oxide fuel cell (SOFC) that has features varying in size by three orders of magnitude – from hundreds of nanometre large pores and grains to tens of micron wide functional layers.