X-ray diffuse-scattering study of interfacial morphology and conformal roughness in metallic multilayers.
X-ray diffuse-scattering study of interfacial morphology and conformal roughness in metallic multilayers.
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金属多层膜界面形态和共形粗糙度的 X 射线漫散射研究。
DOI：
10.1103/physrevb.52.r17052
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发表时间：
1995
期刊：
影响因子：
--
通讯作者：
Cookson
中科院分区：
文献类型：
--
作者：
Paniago;Homma;Chow;Moss;Barnea;Parkin;Cookson
用X射线漫散射研究了Ni0.81Fe0.19/Au多层膜界面粗糙度的性质。使用图像板检测器，这种散射可以观察到扩展的动量转移。因此，可以使用共形粗糙度模型来确定界面高度-高度自相关函数的粗糙度指数和截止长度，对于该模型，界面在截止长度内是光滑的。我们还表明，虽然粗糙度是不共形的短长度尺度，过渡到共形的行为发生在从10025到100 μ m。
The nature of the interfacial roughness in Ni 0.81 Fe 0.19/Au multilayers was studied using x-ray diffuse scattering. Using an image-plate detector this scattering could be observed to an extended momentum transfer. The roughness exponent and the cutoff length of the interfacial height-height self-correlation function could thereby be determined using a model of conformal roughness, for which the interfaces are smooth within the cutoff length. We also show that while the roughness is not conformal for short length scales, a transition to conformal behavior occurs from∼ 25 to 100 Å.