Development of confocal micro X-ray fluorescence instrument using two X-ray beams
Development of confocal micro X-ray fluorescence instrument using two X-ray beams
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DOI：
10.1016/j.sab.2007.02.014
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发表时间：
2007-07-01
影响因子：
3.3
通讯作者：
Ding, Xunliang
中科院分区：
文献类型：
--
作者：
Tsuji, Kouichi;Nakano, Kazuhiko;Ding, Xunliang
研制了新型共焦显微X射线荧光仪。该仪器有两个独立的带有钼靶的微型X射线管。每个 X 射线管上都连接有完整的多毛细管 X 射线透镜。另一个半多毛细管透镜连接到硅漂移 X 射线探测器 (SDD)。将三个透镜的焦点调整到共同位置。研究了两束 X 射线激发的影响。该仪器可实现高灵敏度的三维 X 射线荧光分析。我们证实，通过采用共焦配置的两个独立的 X 射线管，样品的 X 射线荧光强度有所增加。黑小麦的元素深度分析表明，小麦籽粒表层中的每种元素都表现出独特的分布。 (c) 2007 Elsevier B.V 保留所有权利。
A new confocal micro X-ray fluorescence instrument was developed. This instrument has two independent micro X-ray tubes with Mo targets. A full polycapillary X-ray lens was attached to each X-ray tube. Another half polycapillary lens was attached to a silicon drift X-ray detector (SDD). The focal spots of the three lenses were adjusted to a common position. The effects of the excitation of two X-ray beams were investigated. The instrument enabled highly sensitive three-dimensional X-ray fluorescence analysis. We confirmed that the X-ray fluorescence intensity frorn the sample increased by applying the two independent X-ray tubes in confocal configuration. Elemental depth profiling of black wheat was demonstrated with the result that each element in the surface coat of a wheat grain showed unique distribution. (c) 2007 Elsevier B.V All rights reserved.