Quantitative AC - Kelvin Probe Force Microscopy
Quantitative AC - Kelvin Probe Force Microscopy
复制标题
DOI：
10.1016/j.mee.2017.01.005
复制
发表时间：
2017-05-25
影响因子：
2.3
通讯作者：
Schitter, Georg
中科院分区：
文献类型：
--
作者：
Kohl, Dominik;Mesquida, Patrick;Schitter, Georg
本文提出了一种新的基于反馈的扫描探针显微镜方法，该方法可以在不需要开尔文探针力显微镜直流偏压的情况下进行表面电位的定量测量。除了频率为ω的正弦激励信号外，还将频率为2 ω的正弦信号施加到导电悬臂梁上。通过在2 ω调制信号的振幅，得到的频率ω的电力分量可以通过反馈控制器消除。当力和悬臂振荡为零时，所需的振幅表示定量的表面电位。在扫描样品时记录这个振幅可以获得表面电位的二维图。分析和实验结果表明，交流-KPFM方法保留了经典KPFM基于补偿的原理，实现了定量测量，而不需要直流偏置。(C) 2017年作者。Elsevier B.V.出版
This paper presents a novel feedback based Scanning Probe Microscopy method which enables quantitative surface potential measurements without the need of the DC bias of Kelvin Probe Force Microscopy. In addition to the sinusoidal excitation signal at frequency omega, a sinusoidal signal with the frequency 2 omega is applied to the conductive cantilever. By modulating the amplitude of the signal at 2 omega, the resulting electric force component at the frequency omega can be nullified by a feedback controller. When the force and, hence, the cantilever oscillation is zero, the required amplitude represents the quantitative surface potential. Recording this amplitude while scanning over the sample allows to acquire a two dimensional map of the surface potential. The AC-KPFM method, shown analytically and with experimental results, keeps the compensation based principle of classical KPFM, resulting in quantitative measurements but without the need of a DC bias. (C) 2017 The Authors. Published by Elsevier B.V.